SAPPHIRE 600 UV-VIS Variable Wavelength DETECTOR

Programmable wavelength change 190 up to 600 nm

Availability
This product cannot be purchased.
Manufacturer
ECOM spol. s r.o.
Part number
67SH000X

 SAPPHIRE 600 UV-VIS Variable Wavelength DETECTOR

is a detector with continuously variable wavelength in the range of 190 – 600 nm and a noise level ± 0.5 x 10-5 AU.
The unit may be used for routine analytical chromatography as well as for preparative chromatography, according to the selected cell.
The unit is easy to operate, reference and sample signals are available for detector diagnostics as well as information on lamp operating hours.
Output signal is available in both digital and analogue form on the output connector. It is possible to control the unit using the keypad or an RS232 interface Connecting capillaries are led from the detector’s right side panel.
The detector is equipped with a high standard deuterium lamp in a special socket that enables easy changing. Wavelength can be programmatically changed during the performance of an analysis. The detector performs automatic wavelength calibration after the lamp has been switched on. A cell is included as a component of the detector 

 USED CELLS

Standard analytical measuring cell HPLC 04 supplied with the unit

volume 10 µl
optical path 5 mm
diameters of capillaries input 1/ 16“ x 0,2mm ; output 1/ 16“ x 0,5 mm

MLCC 02 Microcell (optional)

volume 0,5 µl
optical path 0,8 mm
diameters of capillaries input 1/ 16“ x 0,2mm output 1/ 16“ x 0,2 mm

PLCC 04/05 Preparative cell (optional)

volume (adjustable) 45 μl; 55 μl; 70 μl
optical path (adjustable)0.3 mm; 1.4 mm; 2.4 mm
Connecting of PLCC 04 SS capillaries 1/16" x 1,0mm
Connecting of PLCC 05 FEP 1/8“ x 1/16“

 

Accuracy of adjustment ± 1 nm
Typical spectral half-width 6 nm
Reproducibility ± 0.5 nm
Light source Deuterium discharge lamp
Output for integrator 1 V/AU
Time constant (T90) Fast, middle and slow
Communication RS232
Power supply 100, 115 and 230, 50/ 60 Hz)
Power input 80 VA
Dimensions W x H x D 220 x 170 x 450 mm
Weight 11 kg
Noise level at empty cell (254 nm, TC 1 s) ± 0,5 x 10-5 AU
Drift at empty cell (254 nm after 1 h) 1x 10-4 AU/hr
Materials in contact with mobile phase PTFE; fused silica, stainless steel, Vespel, PEEK
Programming 3 change of wavelength during analysis
Adjustable offset ± 50 mV